Pulsation regions near the static border of optically injected semiconductor lasers using numerical analysis

dc.audience.educationlevelInvestigadores/Researcherses_MX
dc.contributor.advisorCastañon Avila Gerardo Antonio
dc.contributor.authorRodríguez Martínez, Sergio Luis
dc.contributor.catalogeremipsanchezes_MX
dc.contributor.committeememberCampuzano Treviño, Gabriel
dc.contributor.committeememberVargas Rosales, César
dc.contributor.committeememberLezama Cruzvillasante, Fernando
dc.contributor.departmentEscuela de Ingeniería y Cienciases_MX
dc.contributor.institutionCampus Monterreyes_MX
dc.contributor.mentorAldaya Garde, Ivan Aritz
dc.creatorRODRIGUEZ MARTINEZ, SERGIO LUIS; 3012812
dc.date.accepted2023-05-15
dc.date.accessioned2023-09-22T18:23:21Z
dc.date.available2023-09-22T18:23:21Z
dc.date.issued2023-04-01
dc.descriptionhttps://orcid.org/0000-0001-5208-5745es_MX
dc.description.abstractIn this thesis, we analyze the technique of injection for the generation of optical pulses, as it is believed to have distinct result in a rich and diverse set of dynamical behaviors. The study focuses primarily on identifying and exploiting pulsing regimes, which can be beneficial for a wide range of applications or can lead to undesired instabilities. The thesis develops a novel multi-metric method to automatically identify pulsing regimes in the parameter space. The method is applied to extensive numerical simulations to demonstrate that these regimes occur in the vicinity of the static synchronization boundary. Additionally, analyzing these pulsing regimes, the study identifies pulsations with repetition rates ranging from several MHz up to more than 1 GHz. The effect of the linewidth enhancement factor and the slave-laser bias current is also analyzed, revealing that a linewidth enhancement factor of 3 and a higher bias current lead to broader regions of pulsation regimes. Finally, some simulation results are presented using the rate equations considering the spontaneous emission and the Langevin forces.es_MX
dc.description.degreeDoctorado en Ciencias de Ingenieríaes_MX
dc.format.mediumTextoes_MX
dc.identificator1||22||2209||220910es_MX
dc.identifier.citationRodriguez, S. et al (2023). Pulsation regions near the static border of optically injected semiconductor lasers using numerical analysis [Instituto Tecnológico y de Estudios Superiores de Monterrey].es_MX
dc.identifier.cvu782730es_MX
dc.identifier.doihttps://doi.org/10.1364/AO.452938
dc.identifier.orcidhttps://orcid.org/0000-0002-6161-647Xes_MX
dc.identifier.scopusid57653256300es_MX
dc.identifier.urihttps://hdl.handle.net/11285/651174
dc.language.isoenges_MX
dc.publisherInstituto Tecnológico y de Estudios Superiores de Monterreyes_MX
dc.relationCONACYTes_MX
dc.relationTec de Monterreyes_MX
dc.relation.isFormatOfpublishedVersiones_MX
dc.relation.isreferencedbyREPOSITORIO NACIONAL CONACYT
dc.rightsopenAccesses_MX
dc.rights.embargoreasonPara la publicación de un nuevo artículo.es_MX
dc.rights.urihttp://creativecommons.org/licenses/by/4.0es_MX
dc.subject.classificationCIENCIAS FÍSICO MATEMÁTICAS Y CIENCIAS DE LA TIERRA::FÍSICA::ÓPTICA::LÁSERESes_MX
dc.subject.keywordPulsationes_MX
dc.subject.keywordRegimees_MX
dc.subject.keywordNumerical analysises_MX
dc.subject.keywordSemiconductor laseres_MX
dc.subject.keywordOptical injectiones_MX
dc.subject.lcshSciencees_MX
dc.titlePulsation regions near the static border of optically injected semiconductor lasers using numerical analysises_MX
dc.typeTesis de doctorado

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